| 9211403 |
Steerable stylet |
Timothy Beerling, Matthew I. Haller |
2015-12-15 |
| 8943443 |
Verification of computer simulation of photolithographic process |
Rene Blanquies |
2015-01-27 |
| 8245161 |
Verification of computer simulation of photolithographic process |
Rene Blanquies |
2012-08-14 |
| 7576317 |
Calibration standard for a dual beam (FIB/SEM) machine |
Mehran Nasser-Ghodsi |
2009-08-18 |
| 7453571 |
Dimensional calibration standards |
Jerry Prochazka, Ellen Laird, Pat Brady, Rene Blanquies |
2008-11-18 |
| 7423264 |
Atomic force microscope |
Christopher F. Bevis |
2008-09-09 |
| 7372016 |
Calibration standard for a dual beam (FIB/SEM) machine |
Mehran Nasser-Ghodsi |
2008-05-13 |
| 7301638 |
Dimensional calibration standards |
Jerry Prochazka, Ellen Laird, Pat Brady, Rene Blanquies |
2007-11-27 |
| 6821812 |
Structure and method for mounting a small sample in an opening in a larger substrate |
Dimitar Ovtcharov, Rene Blanquies |
2004-11-23 |
| 6646737 |
Submicron dimensional calibration standards and methods of manufacture and use |
Ian Smith, Ellen Laird, Bradley W. Scheer |
2003-11-11 |
| 6005251 |
Voice coil scanner for use in scanning probe microscope |
John D. Alexander, Thai Nguyen |
1999-12-21 |
| 5952657 |
Atomic force microscope with integrated optics for attachment to optical microscope |
John D. Alexander, Thai Nguyen |
1999-09-14 |
| 5861624 |
Atomic force microscope for attachment to optical microscope |
John D. Alexander, Thai Nguyen |
1999-01-19 |
| 5595942 |
Method of fabricating cantilever for atomic force microscope having piezoresistive deflection detector |
Thomas R. Albrecht, Robert R. Barrett |
1997-01-21 |
| 5483822 |
Cantilever and method of using same to detect features on a surface |
Thomas R. Albrecht, Robert R. Barrett |
1996-01-16 |
| 5444244 |
Piezoresistive cantilever with integral tip for scanning probe microscope |
Michael D. Kirk, Ian R. Smith, Sean S. Cahill, Timothy G. Slater |
1995-08-22 |
| 5345815 |
Atomic force microscope having cantilever with piezoresistive deflection sensor |
Thomas R. Albrecht, Robert R. Barrett |
1994-09-13 |
| 5066358 |
Nitride cantilevers with single crystal silicon tips |
Calvin F. Quate |
1991-11-19 |
