Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7453571 | Dimensional calibration standards | Marco Tortonese, Jerry Prochazka, Pat Brady, Rene Blanquies | 2008-11-18 |
| 7301638 | Dimensional calibration standards | Marco Tortonese, Jerry Prochazka, Pat Brady, Rene Blanquies | 2007-11-27 |
| 6646737 | Submicron dimensional calibration standards and methods of manufacture and use | Marco Tortonese, Ian Smith, Bradley W. Scheer | 2003-11-11 |
| 6358860 | Line width calibration standard manufacturing and certifying method | Bradley W. Scheer | 2002-03-19 |
| 5677765 | Method for calibrating a topographic instrument | W. Murray Bullis, James J. Greed, Jr., Bradley W. Scheer | 1997-10-14 |
| 5599464 | Formation of atomic scale vertical features for topographic instrument calibration | W. Murray Bullis, James J. Greed, Jr., Bradley W. Scheer | 1997-02-04 |