Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6646737 | Submicron dimensional calibration standards and methods of manufacture and use | Marco Tortonese, Ian Smith, Ellen Laird | 2003-11-11 |
| 6358860 | Line width calibration standard manufacturing and certifying method | Ellen Laird | 2002-03-19 |
| 6016684 | Certification of an atomic-level step-height standard and instrument calibration with such standards | J. Jerry Prochazka | 2000-01-25 |
| 5955654 | Calibration standard for microroughness measuring instruments | John C. Stover | 1999-09-21 |
| 5677765 | Method for calibrating a topographic instrument | Ellen Laird, W. Murray Bullis, James J. Greed, Jr. | 1997-10-14 |
| 5659388 | Method and apparatus for operating a condensation nucleus counter with improved counting stability and accuracy over a variable detection threshold | Craig A. Scheer | 1997-08-19 |
| 5599464 | Formation of atomic scale vertical features for topographic instrument calibration | Ellen Laird, W. Murray Bullis, James J. Greed, Jr. | 1997-02-04 |
| 5198869 | Reference wafer for haze calibration | Robert J. Monteverde | 1993-03-30 |
| 5194297 | System and method for accurately depositing particles on a surface | Paul A. Konicek | 1993-03-16 |
| 5078492 | Test wafer for an optical scanner | — | 1992-01-07 |