Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7512248 | Method of incorporating a secondary image into a primary image | — | 2009-03-31 |
| 6590703 | Optical system for scanning microscope | Sang-Il Park | 2003-07-08 |
| 6265718 | Scanning probe microscope with scan correction | Sang-Il Park | 2001-07-24 |
| 6130427 | Scanning probe microscope with multimode head | Sang-Il Park, Frederick I. Linker, Michael D. Kirk, John D. Alexander, Sung Il Park | 2000-10-10 |
| 6057547 | Scanning probe microscope with scan correction | Sang-Il Park | 2000-05-02 |
| 5939719 | Scanning probe microscope with scan correction | Sang-Il Park, Michael D. Kirk | 1999-08-17 |
| 5877891 | Scanning probe microscope having a single viewing device for on-axis and oblique optical views | Sano-Il Park, Frederick I. Linker | 1999-03-02 |
| 5838349 | Electrohydrodynamic ink jet printer and printing method | Dong Ho Choi | 1998-11-17 |
| 5714756 | Scanning probe microscope having a single viewing device for on-axis and oblique angle views | Sang-Il Park, Frederick I. Linker | 1998-02-03 |
| 5672816 | Large stage system for scanning probe microscopes and other instruments | Sang-Il Park, Michael D. Kirk | 1997-09-30 |
| 5496999 | Scanning probe microscope | Frederick I. Linker, Michael D. Kirk, John D. Alexander, Sang-Il Park, Sung Il Park +1 more | 1996-03-05 |
| 5448399 | Optical system for scanning microscope | Sang-Il Park, Frederick I. Linker | 1995-09-05 |
| 5444244 | Piezoresistive cantilever with integral tip for scanning probe microscope | Michael D. Kirk, Marco Tortonese, Sean S. Cahill, Timothy G. Slater | 1995-08-22 |
| 5376790 | Scanning probe microscope | Frederick I. Linker, Michael D. Kirk, John D. Alexander, Sang-Il Park, Sung Il Park | 1994-12-27 |
| 5184021 | Method and apparatus for measuring the dimensions of patterned features on a lithographic photomask | — | 1993-02-02 |
| 4847823 | Method and apparatus for reading or measuring magneto-optical storage media using pinhole aperture | James T. Lindow, Simon Bennett | 1989-07-11 |
| 4748335 | Method and aparatus for determining surface profiles | James T. Lindow, Simon Bennett | 1988-05-31 |
| RE32660 | Confocal optical imaging system with improved signal-to-noise ratio | James T. Lindow, Simon Bennett | 1988-05-03 |
| 4707610 | Method and apparatus for measuring surface profiles | James T. Lindow, Simon Bennett | 1987-11-17 |
| 4689491 | Semiconductor wafer scanning system | James T. Lindow, Simon Bennett, Gary A. Melmon | 1987-08-25 |
| 4634880 | Confocal optical imaging system with improved signal-to-noise ratio | James T. Lindow, Simon Bennett | 1987-01-06 |
| 4367648 | Dark field viewing apparatus | David Alexander James Sinclair | 1983-01-11 |