| 9110092 |
Scanning probe based apparatus and methods for low-force profiling of sample surfaces and detection and mapping of local mechanical and electromagnetic properties in non-resonant oscillatory mode |
Serguei Magonov, Sergey Belikov, Craig Gordon Wall, Stanislav Leesment, Viktor Bykov |
2015-08-18 |
| 8087289 |
High resolution surface potential microscope |
Sergei Magonov |
2012-01-03 |
| 6794886 |
Tank probe for measuring surface conductance |
Dong Chen, Amin Samsavar |
2004-09-21 |
| 6130427 |
Scanning probe microscope with multimode head |
Sang-Il Park, Frederick I. Linker, Ian R. Smith, Michael D. Kirk, Sung Il Park |
2000-10-10 |
| 6005251 |
Voice coil scanner for use in scanning probe microscope |
Marco Tortonese, Thai Nguyen |
1999-12-21 |
| 5952657 |
Atomic force microscope with integrated optics for attachment to optical microscope |
Marco Tortonese, Thai Nguyen |
1999-09-14 |
| 5861624 |
Atomic force microscope for attachment to optical microscope |
Marco Tortonese, Thai Nguyen |
1999-01-19 |
| 5811821 |
Single axis vibration reducing system |
Michael D. Kirk |
1998-09-22 |
| 5496999 |
Scanning probe microscope |
Frederick I. Linker, Michael D. Kirk, Sang-Il Park, Sung Il Park, Ian R. Smith +1 more |
1996-03-05 |
| 5376790 |
Scanning probe microscope |
Frederick I. Linker, Michael D. Kirk, Sang-Il Park, Sung Il Park, Ian R. Smith |
1994-12-27 |