Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12416092 | Plating apparatus | Yasuyuki Masuda | 2025-09-16 |
| 12378689 | Plating apparatus and contact cleaning method | Kentaro Yamamoto, Kazuhito Tsuji | 2025-08-05 |
| 12359339 | Plating apparatus and substrate holder operation method | Masaya Seki | 2025-07-15 |
| 12351932 | Plating process method | Yasuyuki Masuda | 2025-07-08 |
| 12270120 | Plating apparatus and plating method | Masaya Seki, Masashi Shimoyama, Shao Hua Chang | 2025-04-08 |
| 12264406 | Plating apparatus and substrate cleaning method | Kentaro Yamamoto, Kazuhito Tsuji | 2025-04-01 |
| 12258673 | Plating apparatus | — | 2025-03-25 |
| 12180606 | Plating apparatus | Masaya Seki, Shao Hua Chang | 2024-12-31 |
| 12134833 | Plating apparatus and cleaning method of contact member of plating apparatus | Masaya Seki, Shao Hua Chang | 2024-11-05 |
| 11906299 | Plating apparatus and film thickness measuring method for substrate | Masaya Seki, Shao Hua Chang | 2024-02-20 |
| 11604150 | Device for measuring bump height, apparatus for processing substrate, method of measuring bump height, and storage medium | Takahisa Okuzono, Jumpei Fujikata, Hideki Takayanagi | 2023-03-14 |
| 11603601 | Plating device and resistor | Mitsuhiro Shamoto, Shao Hua Chang, Masashi Shimoyama | 2023-03-14 |
| 11600514 | Substrate holding device | Junitsu Yamakawa | 2023-03-07 |
| 11335484 | Permanent magnet | Ryuji Hashimoto, Takashi Watanabe | 2022-05-17 |
| 11192151 | Cleaning device, plating device including the same, and cleaning method | Shao Hua Chang | 2021-12-07 |
| 11008668 | Inspection method, inspection device, and plating apparatus including the same | — | 2021-05-18 |
| 10910334 | Device for inspecting a bump height surrounded by resist, device for processing a substrate, method for inspecting a bump height, and storage medium | Takahisa Okuzono, Jumpei Fujikata | 2021-02-02 |
| 10830834 | Current measuring module using inspection substrate and inspection substrate | Hiroyuki Takenaka, Mitsutoshi Yahagi | 2020-11-10 |
| 10366814 | Permanent magnet | Masashi Ito, Tomoko Kitamura | 2019-07-30 |
| 6115153 | Reflection-type hologram scale and optical displacement measuring apparatus therewith | Motohiro Osaki, Kuniaki Obata, Masaaki Miyashita | 2000-09-05 |