MC

Mark C. Carbone

AS Aehr Test Systems: 17 patents #7 of 36Top 20%
Overall (All Time): #248,198 of 4,157,543Top 6%
18
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12163999 Apparatus for testing electronic devices Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey +7 more 2024-12-10
11860221 Apparatus for testing electronic devices Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey +7 more 2024-01-02
11255903 Apparatus for testing electronic devices Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey +7 more 2022-02-22
10852347 Apparatus for testing electronic devices Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey +7 more 2020-12-01
10094872 Apparatus for testing electronic devices Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey +7 more 2018-10-09
9316683 Apparatus for testing electronic devices Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey +7 more 2016-04-19
9151797 Apparatus for testing electronic devices Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey +7 more 2015-10-06
8747123 Apparatus for testing electronic devices Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey +7 more 2014-06-10
8628336 Apparatus for testing electronic devices Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey +7 more 2014-01-14
8506335 Apparatus for testing electronic devices Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey +7 more 2013-08-13
8388357 Apparatus for testing electronic devices Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey +7 more 2013-03-05
8118618 Apparatus for testing electronic devices Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey +7 more 2012-02-21
7541822 Wafer burn-in and text employing detachable cartridge Frank O. Uher, John Andberg, Donald P. Richmond, II 2009-06-02
7088117 Wafer burn-in and test employing detachable cartridge Frank O. Uher, John Andberg, Donald P. Richmond, II 2006-08-08
6580283 Wafer level burn-in and test methods Frank O. Uher, John Andberg, Jerzy Lobacz, Donald P. Richmond, II 2003-06-17
6556032 Wafer-burn-in and test employing detachable cartridge Frank O. Uher, John Andberg, Donald P. Richmond, II 2003-04-29
6413113 Kinematic coupling Frank O. Uher, John Andberg, Donald P. Richmond, II 2002-07-02
6340895 Wafer-level burn-in and test cartridge Frank O. Uher, John Andberg, Donald P. Richmond, II 2002-01-22