Issued Patents All Time
Showing 1–25 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9194909 | Single level of metal test structure for differential timing and variability measurements of integrated circuits | Mark B. Ketchen, Chin Kim | 2015-11-24 |
| 9110777 | Reducing performance degradation in backup semiconductor chips | Aditya Bansal, Keith A. Jenkins, Jae-Joon Kim, Barry P. Linder, Kai Zhao | 2015-08-18 |
| 9075109 | Single level of metal test structure for differential timing and variability measurements of integrated circuits | Mark B. Ketchen, Chin Kim | 2015-07-07 |
| 8723528 | Active 2-dimensional array structure for parallel testing | Mark B. Ketchen | 2014-05-13 |
| 8589842 | Device-based random variability modeling in timing analysis | Eric Jason Fluhr, Stephen G. Shuma, Debjit Sinha, Chandramouli Visweswariah, James D. Warnock +1 more | 2013-11-19 |
| 8456169 | High speed measurement of random variation/yield in integrated circuit device testing | Mark B. Ketchen, Qingqing Liang, Edward P. Maciejewski | 2013-06-04 |
| 8310269 | Measurement of partially depleted silicon-on-insulator CMOS circuit leakage current under different steady state switching conditions | Mark B. Ketchen | 2012-11-13 |
| 8248094 | Acquisition of silicon-on-insulator switching history effects statistics | Mark B. Ketchen | 2012-08-21 |
| 8179120 | Single level of metal test structure for differential timing and variability measurements of integrated circuits | Mark B. Ketchen, Chin Kim | 2012-05-15 |
| 8027797 | Methods and apparatus for determining a switching history time constant in an integrated circuit device | Mark B. Ketchen, Dale J. Pearson | 2011-09-27 |
| 7595654 | Methods and apparatus for inline variability measurement of integrated circuit components | Karen Gettings, Wilfried E. Haensch, Brian L. Ji, Mark B. Ketchen | 2009-09-29 |
| 7583125 | Methods and apparatus for pulse generation used in characterizing electronic fuses | Mark B. Ketchen, Chandrasekharan Kothandaraman, Edward P. Maciejewski | 2009-09-01 |
| 7512509 | M1 testable addressable array for device parameter characterization | Mark B. Ketchen | 2009-03-31 |
| 7504875 | Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuit | Mark B. Ketchen, Chandrasekharan Kothandaraman, Edward P. Maciejewski | 2009-03-17 |
| 7504896 | Methods and apparatus for inline measurement of switching delay history effects in PD-SOI technology | Mark B. Ketchen | 2009-03-17 |
| 7355902 | Methods and apparatus for inline characterization of high speed operating margins of a storage element | Mark B. Ketchen | 2008-04-08 |
| 7342406 | Methods and apparatus for inline variability measurement of integrated circuit components | Karen Gettings, Wilfried E. Haensch, Brian L. Ji, Mark B. Ketchen | 2008-03-11 |
| 7295057 | Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuit | Mark B. Ketchen, Chandrasekharan Kothandaraman, Edward P. Maciejewski | 2007-11-13 |
| 7265639 | Methods and apparatus for ring oscillator based MOSFET gate capacitance measurements | Mark B. Ketchen | 2007-09-04 |
| 7190233 | Methods and apparatus for measuring change in performance of ring oscillator circuit | Mark B. Ketchen | 2007-03-13 |
| 7176695 | Method and apparatus for measuring transfer characteristics of a semiconductor device | Mark B. Ketchen | 2007-02-13 |
| 7145347 | Method and apparatus for measuring transfer characteristics of a semiconductor device | Mark B. Ketchen | 2006-12-05 |
| 7085658 | Method and apparatus for rapid inline measurement of parameter spreads and defects in integrated circuit chips | Mark B. Ketchen | 2006-08-01 |
| 7069525 | Method and apparatus for determining characteristics of MOS devices | Mark B. Ketchen | 2006-06-27 |
| 6960926 | Method and apparatus for characterizing a circuit with multiple inputs | Carl J. Anderson, Mark B. Ketchen | 2005-11-01 |