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Method and system for forming an oxynitride layer by performing oxidation and nitridation concurrently |
Cory Wajda, Toshihara Furakawa |
2009-04-14 |
| 7501352 |
Method and system for forming an oxynitride layer |
Masanobu Igeta, Cory Wajda, David L. O'Meara, Toshihara Eurakawa |
2009-03-10 |
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Formation of ultra-thin oxide layers by self-limiting interfacial oxidation |
David L. O'Meara, Cory Wajda, Anthony Dip, Michael Toeller, Toshihara Furukawa +6 more |
2007-06-26 |
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Method of forming uniform ultra-thin oxynitride layers |
David L. O'Meara, Cory Wajda, Anthony Dip, Michael Toeller, Toshihara Furukawa +6 more |
2007-04-10 |
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Forming gate oxides having multiple thicknesses |
Anthony I. Chou, Michael P. Chudzik, Toshiharu Furukawa, Oleg Gluschenkov, Paul Kirsch +4 more |
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Interfacial oxidation process for high-k gate dielectric process integration |
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2005-12-13 |
| 6930060 |
Method for forming a uniform distribution of nitrogen in silicon oxynitride gate dielectric |
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