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Heterojunction bipolar transistors with undercut extrinsic base regions |
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Heterojunction bipolar transistors with a controlled undercut formed beneath the extrinsic base |
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Waveguide devices with supporting anchors |
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2016-03-01 |
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Bipolar junction transistors with reduced base-collector junction capacitance |
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| 9231087 |
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2016-01-05 |
| 9224843 |
Formation of a high aspect ratio trench in a semiconductor substrate and a bipolar semiconductor device having a high aspect ratio trench isolation region |
John Benoit, Qizhi Liu |
2015-12-29 |
| 9093491 |
Bipolar junction transistors with reduced base-collector junction capacitance |
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| 9059234 |
Formation of a high aspect ratio trench in a semiconductor substrate and a bipolar semiconductor device having a high aspect ratio trench isolation region |
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2015-06-16 |
| 8236580 |
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| 7957917 |
Copper contamination detection method and system for monitoring copper contamination |
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Copper contamination detection method and system for monitoring copper contamination |
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2011-02-15 |
| 7804151 |
Integrated circuit structure, design structure, and method having improved isolation and harmonics |
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2010-09-28 |
| 7446007 |
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James W. Adkisson, Marc W. Cantell, James V. Hart, III, Dale W. Martin |
2008-11-04 |
| 7342290 |
Semiconductor metal contamination reduction for ultra-thin gate dielectrics |
Jay Burnham, Kenneth R. Gault, Mousa H. Ishaq, Steven M. Shank, Mary A. St. Lawrence |
2008-03-11 |
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Bilayer ultra-thin gate dielectric and process for semiconductor metal contamination reduction |
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2005-01-04 |
