Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10724856 | Image analysis apparatus and charged particle beam apparatus | Atsuko Yamaguchi, Kazuhisa Hasumi | 2020-07-28 |
| 10186399 | Scanning electron microscope | Mayuka Osaki, Chie Shishido, Maki Tanaka, Fumihiro Sasajima, Makoto Suzuki +1 more | 2019-01-22 |
| 10096451 | Pattern measurement device and computer program | Tomoaki Yamazaki | 2018-10-09 |
| 9329034 | Pattern determination device and computer program | Satoru Yamaguchi, Fumihiro Sasajima | 2016-05-03 |
| 8953855 | Edge detection technique and charged particle radiation equipment | Osamu Komuro, Satoru Yamaguchi, Fumihiro Sasajima | 2015-02-10 |