Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7223616 | Test structures in unused areas of semiconductor integrated circuits and methods for designing the same | Maureen Ardans, Jun Song | 2007-05-29 |
| 7190185 | Methodology to measure many more transistors on the same test area | Minxuan Liu, John Quillian Walker, II, Nabil Monsour, Carl Monzel | 2007-03-13 |
| 6977512 | Method and apparatus for characterizing shared contacts in high-density SRAM cell design | Subramanian Ramesh, Ruggero Castagnetti | 2005-12-20 |
| 6978407 | Method and architecture for detecting random and systematic transistor degradation for transistor reliability evaluation in high-density memory | Subramanian Ramesh, Ruggero Castagnetti | 2005-12-20 |
| 6472715 | Reduced soft error rate (SER) construction for integrated circuit structures | Yauh-Ching Liu, Helmut Puchner, Ruggero Castagnetti, Weiran Kong, Lee Phan +1 more | 2002-10-29 |
| 6442061 | Single channel four transistor SRAM | Weiran Kong, Gary K. Giust, Ramnath Venkatraman, Yauh-Ching Liu, Ruggero Castagnetti +3 more | 2002-08-27 |