Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7379281 | Bias for electrostatic discharge protection | William Loh, Jau-Wen Chen | 2008-05-27 |
| 7190185 | Methodology to measure many more transistors on the same test area | Franklin Duan, John Quillian Walker, II, Nabil Monsour, Carl Monzel | 2007-03-13 |