Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7190185 | Methodology to measure many more transistors on the same test area | Franklin Duan, Minxuan Liu, John Quillian Walker, II, Carl Monzel | 2007-03-13 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7190185 | Methodology to measure many more transistors on the same test area | Franklin Duan, Minxuan Liu, John Quillian Walker, II, Carl Monzel | 2007-03-13 |