EL

Ed C. Lee

AN Asml Holding N.V.: 8 patents #62 of 520Top 15%
SG Silicon Valley Group: 4 patents #3 of 97Top 4%
AB Asml Netherlands B.V.: 1 patents #2,025 of 3,192Top 65%
GE Genus: 1 patents #35 of 76Top 50%
HO Honeywell: 1 patents #7,507 of 14,447Top 55%
Overall (All Time): #326,393 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7625692 Yield and line width performance for liquid polymers and other materials Emir Gurer, Murthy Krishna, Reese Reynolds, John Salois, Royal Cherry 2009-12-01
7255975 Yield and line width performance for liquid polymers and other materials Emir Gurer, Murthy Krishna, Reese Reynolds, John Salois, Royal Cherry 2007-08-14
7208262 Yield and line width performance for liquid polymers and other materials Emir Gurer, Murthy Krishna, Reese Reynolds, John Salois, Royal Cherry 2007-04-24
6977098 Method of uniformly coating a substrate Emir Gurer, Tom Zhong, John Lewellen, Robert P. Mandal, James C. Grambow +3 more 2005-12-20
6955720 Plasma deposition of spin chucks to reduce contamination of Silicon wafers Emir Gurer, Richard Savage 2005-10-18
6911091 Environment exchange control for material on a wafer surface Emir Gurer, Tom Zhong, Kevin Golden, John Lewellen, Scott C. Wackerman +1 more 2005-06-28
6905547 Method and apparatus for flexible atomic layer deposition Ana R. Londergan, Thomas E. Seidel, Lawrence D. Matthysse 2005-06-14
6844027 Environment exchange control for material on a wafer surface Emir Gurer, Tom Zhong, Kevin Golden, John Lewellen, Scott C. Wackerman +1 more 2005-01-18
6780461 Environment exchange control for material on a wafer surface Emir Gurer, Tom Zhong, Kevin Golden, John Lewellen, Scott C. Wackerman +1 more 2004-08-24
6669779 Yield and line width performance for liquid polymers and other materials Emir Gurer, Murthy Krishna, Reese Reynolds, John Salois, Royal Cherry 2003-12-30
6468586 Environment exchange control for material on a wafer surface Emir Gurer, Tom Zhong, Kevin Golden, John Lewellen, Scott C. Wackerman +1 more 2002-10-22
6254936 Environment exchange control for material on a wafer surface Emir Gurer, Tom Zhong, Kevin Golden, John Lewellen, Reese Reynolds +1 more 2001-07-03
6248171 Yield and line width performance for liquid polymers and other materials Emir Gurer, Murthy Krishna, Reese Reynolds, John Salois, Royal Cherry 2001-06-19
6242364 Plasma deposition of spin chucks to reduce contamination of silicon wafers Emir Gurer, Richard Savage 2001-06-05
4566026 Integrated circuit bimetal layer Jon A. Roberts 1986-01-21