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Multi-rate sampling for hierarchical system analysis |
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Decision boundary enhancement for learning models |
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Iterative approach to determine failure threshold associated with desired circuit yield in integrated circuits |
Tong Li, Pravin Kamdar, Richard Daniel Kimmel |
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Adaptive accelerated yield analysis |
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On-demand table model for semiconductor device evaluation |
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2014-09-02 |
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System and methodology for determining layout-dependent effects in ULSI simulation |
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Pulse waveform timing in EinsTLT templates |
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2010-01-05 |
