Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9679742 | Method for optimizing charged particle beams formed by shaped apertures | Richard Swinford, Mostafa Maazouz, William M. Steinhardt | 2017-06-13 |
| 9401262 | Multi-source plasma focused ion beam system | Noel Smith, Clive D. Chandler, Mark W. Utlaut, Paul P. Tesch | 2016-07-26 |
| 9029812 | Multi-source plasma focused ion beam system | Noel Smith, Clive D. Chandler, Mark W. Utlaut, Paul P. Tesch | 2015-05-12 |
| 8907296 | Charged particle beam system aperture | N. William Parker, Mark W. Utlaut, Jeremy Graham | 2014-12-09 |
| 8803102 | Retarding field analyzer integral with particle beam column | James B. McGinn, Charles Otis | 2014-08-12 |
| 8294093 | Wide aperature wien ExB mass filter | N. William Parker | 2012-10-23 |
| 8283629 | Aberration-corrected wien ExB mass filter with removal of neutrals from the Beam | N. William Parker, Mark W. Utlaut | 2012-10-09 |
| 7226663 | Method for synthesizing nanoscale structures in defined locations | Jun Jiao, Lifeng Dong, Sean Foxley | 2007-06-05 |
| 6956219 | MEMS based charged particle deflector design | Rahul Saini, Zoran Jandric | 2005-10-18 |