Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9874606 | Selective per-cycle masking of scan chains for system level test | Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee | 2018-01-23 |
| 9377508 | Selective per-cycle masking of scan chains for system level test | Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Jerzy Tyszer | 2016-06-28 |
| 8832512 | Low power compression of incompatible test cubes | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Przemyslaw Szczerbicki, Jerzy Tyszer | 2014-09-09 |
| 8726113 | Selective per-cycle masking of scan chains for system level test | Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Jerzy Tyszer | 2014-05-13 |
| 8347159 | Compression based on deterministic vector clustering of incompatible test cubes | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer | 2013-01-01 |
| 8301945 | Decompressors for low power decompression of test patterns | Janusz Rajski, Grzegorz Mrugalski, Jerzy Tyszer | 2012-10-30 |
| 8290738 | Low power scan testing techniques and apparatus | Xijiang Lin, Mark Kassab, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer | 2012-10-16 |
| 8166359 | Selective per-cycle masking of scan chains for system level test | Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Jerzy Tyszer | 2012-04-24 |
| 8046653 | Low power decompression of test cubes | Janusz Rajski, Grzegorz Mrugalski, Jerzy Tyszer | 2011-10-25 |
| 8015461 | Decompressors for low power decompression of test patterns | Janusz Rajski, Grzegorz Mrugalski, Jerzy Tyszer | 2011-09-06 |
| 7925465 | Low power scan testing techniques and apparatus | Xijiang Lin, Mark Kassab, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer | 2011-04-12 |
| 7797603 | Low power decompression of test cubes | Janusz Rajski, Grzegorz Mrugalski, Jerzy Tyszer | 2010-09-14 |
| 7647540 | Decompressors for low power decompression of test patterns | Janusz Rajski, Grzegorz Mrugalski, Jerzy Tyszer | 2010-01-12 |