Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7518387 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more | 2009-04-14 |
| 7489149 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more | 2009-02-10 |
| 7482823 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more | 2009-01-27 |
| 7436194 | Shielded probe with low contact resistance for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more | 2008-10-14 |
| 7340703 | Test structures and method for interconnect impedance property extraction | Hazem Hegazy, Wael Fikry Farouk Fikry Abdalla | 2008-03-04 |
| 7304488 | Shielded probe for high-frequency testing of a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more | 2007-12-04 |
| 7161363 | Probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more | 2007-01-09 |
| 6815963 | Probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more | 2004-11-09 |