Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12299951 | Edge center point-based characterization of semiconductor layout designs | Ahmed Hamed-Fatehy, Sara Khalaf, Omar ElSewefy | 2025-05-13 |
| 12182487 | Controllable pattern clustering for characterized semiconductor layout designs | Ahmed Hamed Fathi Hamed, Omar ElSewefy, Sara Khalaf | 2024-12-31 |
| 12032892 | Semiconductor layout context around a point of interest | David Abercrombie, Mohamed Alimam Mohamed Selim, Mohamed Bahnas, Ahmed Hamed Fathi Hamed | 2024-07-09 |
| 11687695 | Shadow feature-based determination of capacitance values for integrated circuit (IC) layouts | Omar ElSewefy | 2023-06-27 |
| 11017147 | Edge-based camera for characterizing semiconductor layout designs | Ahmed Hamed Fathi Hamed, Omar ElSewefy | 2021-05-25 |
| 8356265 | Offset fill | Fady Fouad | 2013-01-15 |
| 7340703 | Test structures and method for interconnect impedance property extraction | Amr M. E. Safwat, Wael Fikry Farouk Fikry Abdalla | 2008-03-04 |