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Shielded probe for testing a device under test |
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2009-04-14 |
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Shielded probe for testing a device under test |
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2009-02-10 |
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Shielded probe for testing a device under test |
K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more |
2009-01-27 |
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Shielded probe with low contact resistance for testing a device under test |
K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more |
2008-10-14 |
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Test structures and method for interconnect impedance property extraction |
Hazem Hegazy, Wael Fikry Farouk Fikry Abdalla |
2008-03-04 |
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Shielded probe for high-frequency testing of a device under test |
K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more |
2007-12-04 |
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Probe for testing a device under test |
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2007-01-09 |
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