Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12299951 | Edge center point-based characterization of semiconductor layout designs | Hazem Hegazy, Ahmed Hamed-Fatehy, Sara Khalaf | 2025-05-13 |
| 12182487 | Controllable pattern clustering for characterized semiconductor layout designs | Hazem Hegazy, Ahmed Hamed Fathi Hamed, Sara Khalaf | 2024-12-31 |
| 11687695 | Shadow feature-based determination of capacitance values for integrated circuit (IC) layouts | Hazem Hegazy | 2023-06-27 |
| 11017147 | Edge-based camera for characterizing semiconductor layout designs | Hazem Hegazy, Ahmed Hamed Fathi Hamed | 2021-05-25 |