Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11823883 | Mass spectrometer detector and system and method using the same | Christopher F. Bevis, Yungman Alan Liu, David A. Reed, Eli Cheifetz, Amit Weingarten | 2023-11-21 |
| 11656371 | High dynamic range detector with controllable photon flux functionality | Jonathan Garel, Amit Weingarten, Semyon Shofman | 2023-05-23 |
| 11587776 | Ion detection systems | Semyon Shofman | 2023-02-21 |
| 11536604 | Light sensor assembly in a vacuum environment | Jonathan Garel, Amit Weingarten, Semyon Shofman | 2022-12-27 |
| 11493383 | Magnetic photomultiplier tube system | Semyon Shofman | 2022-11-08 |
| 11183377 | Mass spectrometer detector and system and method using the same | Christopher F. Bevis, Yungman Alan Liu, David A. Reed, Eli Cheifetz, Amit Weingarten | 2021-11-23 |
| 9523714 | Electrical inspection of electronic devices using electron-beam induced plasma probes | Ofer Kadar, Arie Glazer, Ronen Loewinger, Abraham Gross, Daniel Toet | 2016-12-20 |
| 7842933 | System and method for measuring overlay errors | Dimitry Shur | 2010-11-30 |
| 7602197 | High current electron beam inspection | Dmitry Shur, Christopher G. Talbot | 2009-10-13 |
| 7476875 | Contact opening metrology | Chris Talbot, Dmitry Shur, Andreas Hegedus | 2009-01-13 |
| 7473911 | Specimen current mapper | Dror Shemesh, Yaniv Brami, Dmitry Shur | 2009-01-06 |
| 7381978 | Contact opening metrology | Chris Talbot, Dmitry Shur, Andreas Hegedus | 2008-06-03 |
| 7279689 | Contact opening metrology | Chris Talbot, Dmitry Shur, Andreas Hegedus | 2007-10-09 |
| 7170056 | Methodology and apparatus for leakage detection | Dmirty Shur | 2007-01-30 |
| 7078690 | Monitoring of contact hole production | Avi Simon | 2006-07-18 |
| 7038224 | Contact opening metrology | Chris Talbot, Dmitry Shur, Andreas Hegedus | 2006-05-02 |
| 6781126 | Auger-based thin film metrology | Avi Simon | 2004-08-24 |
| 6433356 | Hybrid organic-inorganic semiconductor structures and sensors based thereon | David Cahen, Konstantin Gartsman, Ron Naaman, Abraham Shanzer | 2002-08-13 |
| 6407386 | System and method for automatic analysis of defect material on semiconductors | Noam Dotan | 2002-06-18 |