AS

Akihiko Sekine

TO Topcon: 24 patents #27 of 684Top 4%
KT Kabushiki Kaisha Toshiba: 4 patents #6,684 of 21,451Top 35%
KU Kyoto University: 1 patents #568 of 1,688Top 35%
UE University Of Electro-Communications: 1 patents #47 of 199Top 25%
TK Tokyo Kogaku Kikai: 1 patents #65 of 143Top 50%
Overall (All Time): #164,500 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9476693 Optical property measurement apparatus and optical property measurement method Eriko Watanabe 2016-10-25
9456745 Fundus observation apparatus and fundus image analyzing apparatus Akiko Matsumoto, Yugo Kimura, Masanori Hangai, Nagahisa Yoshimura, Tsutomu Kikawa 2016-10-04
8724870 Ophthalmic observation apparatus Nobusuke Obata, Katsuhiro Yamada 2014-05-13
7760349 Mask-defect inspecting apparatus with movable focusing lens Ikunao Isomura, Toshiyuki Watanabe, Shinji Sugihara, Riki Ogawa 2010-07-20
7551273 Mask defect inspection apparatus Ikunao Isomura, Toshiyuki Watanabe, Shinji Sugihara, Riki Ogawa 2009-06-23
7522276 Pattern inspection method Toru Tojo, Toshiyuki Watanabe, Ikunao Isomura 2009-04-21
7379176 Mask defect inspection apparatus Ikunao Isomura, Toshiyuki Watanabe, Shinji Sugihara, Riki Ogawa 2008-05-27
7372560 Pattern inspection apparatus Toru Tojo, Toshiyuki Watanabe, Ikunao Isomura 2008-05-13
7348585 Surface inspection apparatus Kazuhiro Miyakawa, Yoichiro Iwa 2008-03-25
7245366 Surface inspection method and surface inspection apparatus Kazuhiro Miyakawa, Yoichiro Iwa 2007-07-17
7154597 Method for inspecting surface and apparatus for inspecting it Kazuhiro Miyakawa, Yoichiro Iwa 2006-12-26
6104481 Surface inspection apparatus Yoichiro Iwa, Hiroaki Soma, Naoto Miki, Hisashi Isozaki, Hisakazu Yoshino 2000-08-15
6100970 Apparatus for inspecting slight defects on a photomask pattern Hisakazu Yoshino, Toru Tojo, Mitsuo Tabata 2000-08-08
5912732 Surface detecting apparatus 1999-06-15
5812259 Method and apparatus for inspecting slight defects in a photomask pattern Hisakazu Yoshino, Toru Tojo, Mitsuo Tabata 1998-09-22
5349399 Intraocular length measuring instrument having phase compensating means 1994-09-20
5347327 Process and apparatus for measuring axial eye length Fumio Ohtomo 1994-09-13
5347328 Apparatus for measuring an intraocular length between anterior and posterior portions of an eye Funio Ohtomo 1994-09-13
5141302 Intraocular length measuring instrument Akihiro Arai, Hideki Hatanaka, Isao Minegishi, Fumio Ohtomo 1992-08-25
5107106 Scanning and detecting optical device Isao Minegishi, Masaru Isono, Fumio Ohtomo 1992-04-21
5088811 Laser beam scanning type eye fundus observing device Masayuki Hideshima, Shinji Wada 1992-02-18
5066116 Optical system in a laser scanning eye fundus camera 1991-11-19
4968130 Laser beam scanning type ophthalmological instrument Masayuki Hideshima, Shinji Wada, Takashi Yokokura 1990-11-06
4933756 Eye fundus camera 1990-06-12
4854691 Laser beam scanning type eye fundus camera Shinji Wada, Takashi Yokokura, Kazuo Nunokawa, Masayuki Hideshima 1989-08-08