Issued Patents All Time
Showing 1–25 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10502630 | Temperature measurement device and temperature measurement method | — | 2019-12-10 |
| 10067233 | Illuminance measuring system | Atsushi Shoji, Akira Ooide | 2018-09-04 |
| 9952091 | Management system for illumination facility | — | 2018-04-24 |
| 9823354 | Illuminance measuring system | Atsushi Shoji, Akira Ooide | 2017-11-21 |
| 9719850 | Spatial light measuring method and spatial light measuring system | Kazunori Sato | 2017-08-01 |
| 8791415 | Electron microscope device | — | 2014-07-29 |
| 8692194 | Electron microscope device | Hirotaka Tanaka | 2014-04-08 |
| 8351115 | Complex type microscopic device | Fumio Ohtomo, Kazuo Nunokawa | 2013-01-08 |
| 8243264 | Measuring apparatus | Yoshiyuki Enomoto | 2012-08-14 |
| 8097849 | Electron microscope device | Fumio Ohtomo | 2012-01-17 |
| 8009286 | Surface inspecting method and device | Takehiro Takase, Takashi Kakinuma, Hiroyuki Maekawa, Fumio Koda, Michihiro Yamazaki | 2011-08-30 |
| 7394532 | Surface inspection method and apparatus | Michihiro Yamazaki, Hiroshi Yoshikawa, Takehiro Takase, Yutaka Shida, Yoichiro Iwa | 2008-07-01 |
| 7352461 | Particle detecting method and storage medium storing program for implementing the method | Susumu Saito, Takashi Kakinuma, Noritaka Nishioka, Akira Noda | 2008-04-01 |
| 7245388 | Method and device for surface inspection | Takuji Sato, Yoshiyuki Enomoto, Hiroyuki Maekawa | 2007-07-17 |
| 7064820 | Surface inspection method and surface inspection system | Michihiro Yamazaki, Hiroshi Yoshikawa, Naoto Miki, Hiroyuki Maekawa, Naohiro Takahashi | 2006-06-20 |
| 7046353 | Surface inspection system | Yoshiyuki Enomoto | 2006-05-16 |
| 6941792 | Surface inspection system | Masanori Matsuda | 2005-09-13 |
| 6847444 | Surface inspecting apparatus and method | Hiroshi Yoshikawa | 2005-01-25 |
| 6771364 | Surface inspecting apparatus | Michihiro Yamazaki, Hiroshi Yoshikawa, Yoichiro Iwa | 2004-08-03 |
| 6654111 | Surface inspection apparatus and method | Hiroshi Yoshikawa | 2003-11-25 |
| 6611328 | Surface inspecting apparatus and method | Yutaka Shida | 2003-08-26 |
| 6587192 | Surface inspecting apparatus and method | Yutaka Shida | 2003-07-01 |
| 6331888 | Method and apparatus for surface inspection | — | 2001-12-18 |
| 6204918 | Apparatus for surface inspection | Yutaka Shida, Takuji Sato | 2001-03-20 |
| 6115117 | Method and apparatus for surface inspection | — | 2000-09-05 |