Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9638729 | Analysis apparatus and analysis method | Yoshihiro Nishimura, Seiji Morishita, Hisahiro Yamaoka, Takumi Hirakawa, Makoto Yonezawa | 2017-05-02 |
| 9360989 | Information processing device, and method for changing execution priority | Takehiro Nakata | 2016-06-07 |
| 8300901 | Similarity analyzing device, image display device, image display program storage medium, and image display method | Isao Funaki, Aki Kita | 2012-10-30 |
| 8107690 | Similarity analyzing device, image display device, image display program storage medium, and image display method | Isao Funaki, Aki Kita | 2012-01-31 |
| 8009286 | Surface inspecting method and device | Hisashi Isozaki, Takehiro Takase, Takashi Kakinuma, Fumio Koda, Michihiro Yamazaki | 2011-08-30 |
| 7986324 | Display device, display program storage medium and display method | Isao Funaki, Aki Kita | 2011-07-26 |
| 7631216 | Information processing apparatus, information processing apparatus control program, and information processing apparatus control method | Masatoshi Kimura, Naoki Iwasa, Kouichi Kawata, Akiko Maruyama | 2009-12-08 |
| 7543083 | Method, apparatus and computer product for identifying the type of peripheral | Tasuku Hayakawa | 2009-06-02 |
| 7245388 | Method and device for surface inspection | Hisashi Isozaki, Takuji Sato, Yoshiyuki Enomoto | 2007-07-17 |
| 7064820 | Surface inspection method and surface inspection system | Hisashi Isozaki, Michihiro Yamazaki, Hiroshi Yoshikawa, Naoto Miki, Naohiro Takahashi | 2006-06-20 |