Issued Patents All Time
Showing 1–25 of 49 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12298285 | Sample measurement device and measurement parameter setting assistance device | — | 2025-05-13 |
| 12292425 | Peak tracking device, peak tracking method and non-transitory computer readable medium storing peak tracking program | — | 2025-05-06 |
| 12021160 | Semiconductor wafer, radiation detection element, radiation detector, and production method for compound semiconductor monocrystalline substrate | Koji Murakami, Ryuichi Hirano | 2024-06-25 |
| 11967659 | Semiconductor wafer, radiation detection element, radiation detector, and production method for compound semiconductor monocrystalline substrate | Koji Murakami, Ryuichi Hirano | 2024-04-23 |
| 11926924 | Indium phosphide substrate, semiconductor epitaxial wafer, method for producing indium phosphide single-crystal ingot and method for producing indium phosphide substrate | Shunsuke Oka, Keita Kawahira | 2024-03-12 |
| 11681778 | Analysis data processing method and analysis data processing device | — | 2023-06-20 |
| 11391852 | Radiation detection element, and method for manufacturing same | Kohei Yamada, Koji Murakami | 2022-07-19 |
| 11371164 | Compound semiconductor and method for producing single crystal of compound semiconductor | Keita Kawahira, Ryuichi Hirano | 2022-06-28 |
| 11349037 | Indium phosphide wafer, photoelectric conversion element, and method for producing a monocrystalline indium phosphide | Masaru Ota, Ryuichi Hirano | 2022-05-31 |
| 11341404 | Analysis-data analyzing device and analysis-data analyzing method that calculates or updates a degree of usefulness of each dimension of an input in a machine-learning model | — | 2022-05-24 |
| 11211505 | Indium phosphide wafer, photoelectric conversion element, and method for producing a monocrystalline indium phosphide | Masaru Ota, Ryuichi Hirano | 2021-12-28 |
| 10725000 | Chromatogram data processing method and device | — | 2020-07-28 |
| 10557215 | CdTe-based compound single crystal and method for producing the same | Kouji Murakami | 2020-02-11 |
| 10429365 | Chromatogram data processing system | Yasuhiro Mito | 2019-10-01 |
| 10416134 | Chromatogram data processing method and chromatogram data processing apparatus | — | 2019-09-17 |
| 10236167 | Peak waveform processing device | — | 2019-03-19 |
| 10198630 | Peak detection method | Hiroaki Kozawa | 2019-02-05 |
| 10199343 | UBM (under bump metal) electrode structure for radiation detector, radiation detector and production method thereof | Makoto Mikami, Kouji Murakami | 2019-02-05 |
| 10161793 | Spectrum analysis apparatus and calibration method | — | 2018-12-25 |
| 10060795 | Multichannel spectrophotometer and data processing method for multichannel spectrophotometer | Masahide Gunji, Kensuke OTAKE | 2018-08-28 |
| 9995922 | Analysis target region setting apparatus | — | 2018-06-12 |
| 9823362 | Radiation detector UBM electrode structure body, radiation detector, and method of manufacturing same | Masaomi Murakami, Makoto Mikami, Kouji Murakami, Toru Imori | 2017-11-21 |
| 9500629 | Chromatogram data processing method and device | — | 2016-11-22 |
| 9362431 | Compound semiconductor single crystal ingot for photoelectric conversion devices, photoelectric conversion device, and production method for compound semiconductor single crystal ingot for photoelectric conversion devices | Ryuichi Hirano | 2016-06-07 |
| 8815010 | InP single crystal wafer and method for producing InP single crystal | Ryuichi Hirano | 2014-08-26 |