Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12399162 | Waveform processing device for chromatogram and waveform processing method for chromatogram | Yuki Ishikawa | 2025-08-26 |
| 11988653 | Chromatograph mass spectrometer | Yuichiro FUJITA, Yasushi Ishihama, Kazuyoshi Yoshii | 2024-05-21 |
| 11946916 | Waveform processing assistance device and waveform processing assistance method | Yuki Ishikawa, Takeshi Yoshida, Yuji Katsuyama, Toshinobu Yanagisawa | 2024-04-02 |
| 11499950 | Peak detection method and data processing device | Shinji KANAZAWA | 2022-11-15 |
| 11321425 | Method and device for processing data | Shinji KANAZAWA | 2022-05-03 |
| 11187685 | Noise level estimation method, measurement data processing device, and program for processing measurement data | — | 2021-11-30 |
| 11152201 | Time-of-flight mass spectrometer | Tomoyuki OSHIRO, Daisuke Okumura, Yuta MIYAZAKI | 2021-10-19 |
| 11094399 | Method, system and program for analyzing mass spectrometoric data | — | 2021-08-17 |
| 10928367 | Peak extraction method and program | — | 2021-02-23 |
| 10890562 | Tandem mass spectrometer | Hideki Yamamoto, Tohru Shiohama, Atsushige IKEDA, Minoru Fujimoto | 2021-01-12 |
| 10739322 | In-waveform peak end point detecting method and detecting device | — | 2020-08-11 |
| 10371676 | Waveform data processing device and waveform data processing program | — | 2019-08-06 |
| 10359404 | Noise level estimation method, measurement data processing device and program for processing measurement data | — | 2019-07-23 |
| 10198630 | Peak detection method | Akira Noda | 2019-02-05 |
| 9595426 | Method and system for mass spectrometry data analysis | Shinichi Yamaguchi | 2017-03-14 |