Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7477373 | Surface inspection method and surface inspection device | Yoichiro Iwa | 2009-01-13 |
| 7417732 | Particle monitoring apparatus and vacuum processing apparatus | Yoichiro Iwa, Susumu Saito | 2008-08-26 |
| 7348585 | Surface inspection apparatus | Yoichiro Iwa, Akihiko Sekine | 2008-03-25 |
| 7245366 | Surface inspection method and surface inspection apparatus | Yoichiro Iwa, Akihiko Sekine | 2007-07-17 |
| 7227649 | Surface inspection apparatus | Yoichiro Iwa | 2007-06-05 |
| 7154597 | Method for inspecting surface and apparatus for inspecting it | Yoichiro Iwa, Akihiko Sekine | 2006-12-26 |
| 6120444 | Noncontact tonometer capable of measuring intraocular tension by optically detecting deformation of cornea caused by air current | Toshifumi Mihashi, Isao Minegishi | 2000-09-19 |