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Confined defect profiling within resistive random memory access cells |
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High productivity combinatorial processing using pressure-controlled one-way valves |
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Metal organic chemical vapor deposition of embedded resistors for ReRAM cells |
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| 9065040 |
Controlling composition of multiple oxides in resistive switching layers using atomic layer deposition |
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| 9040413 |
Using saturated and unsaturated ALD processes to deposit oxides as ReRAM switching layer |
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2015-05-26 |
| 9029192 |
Metal organic chemical vapor deposition of resistive switching layers for ReRAM cells |
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2015-05-12 |
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Nonvolatile resistive memory element with a silicon-based switching layer |
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2015-04-28 |
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Metal aluminum nitride embedded resistors for resistive random memory access cells |
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| 8969129 |
ReRAM cells including TaXSiYN embedded resistors |
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2015-03-03 |
| 8913418 |
Confined defect profiling within resistive random memory access cells |
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2014-12-16 |
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Controlling composition of multiple oxides in resistive switching layers using atomic layer deposition |
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| 8853046 |
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2014-10-07 |
| 8853661 |
Metal aluminum nitride embedded resistors for resistive random memory access cells |
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2014-10-07 |
| 8846484 |
ReRAM stacks preparation by using single ALD or PVD chamber |
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ReRAM cells including TaXSiYN embedded resistors |
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