Issued Patents All Time
Showing 26–40 of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7129745 | Apparatus and methods for adjusting performance of integrated circuits | David Lewis, Vaughn Betz, Irfan Rahim, Peter J. McElheny, Bruce B. Pedersen | 2006-10-31 |
| 7112997 | Apparatus and methods for multi-gate silicon-on-insulator transistors | Minchang Liang | 2006-09-26 |
| 7109748 | Integrated circuits with reduced standby power consumption | Hugh Sungki O, Richard G. Cliff | 2006-09-19 |
| 7067842 | Method and apparatus for monitoring parasitic inductance | Jayakannan Jayapalan, Liping Li | 2006-06-27 |
| 7045427 | Polysilicon gate doping level variation for reduced leakage current | Peter J. McElheny, Priya Selvaraj, Francois Gregoire | 2006-05-16 |
| 6972466 | Bipolar transistors with low base resistance for CMOS integrated circuits | Minchang Liang, Fangyun Richter | 2005-12-06 |
| 6940307 | Integrated circuits with reduced standby power consumption | Hugh Sungki O, Richard G. Cliff | 2005-09-06 |
| 6829127 | High performance capacitor structure | Jayakannan Jayapalan, Francois Gregoire, Peter J. McElheny | 2004-12-07 |
| 6248629 | Process for fabricating a flash memory device | Gu-Fung David Tsuei, Jian Chen | 2001-06-19 |
| 6242924 | Method for electronically measuring size of internal void in electrically conductive lead | Tsui Ting Yiu, Young-Chang Joo, Sunil N. Shabde | 2001-06-05 |
| 5257095 | Common geometry high voltage tolerant long channel and high speed short channel field effect transistors | Salvatore F. Cagnina | 1993-10-26 |
| 5010029 | Method of detecting the width of spacers and lightly doped drain regions | Zahra Hadjizadeh-Amini | 1991-04-23 |
| 4978627 | Method of detecting the width of lightly doped drain regions | Zahra Hadjizadeh-Amini | 1990-12-18 |
| 4734752 | Electrostatic discharge protection device for CMOS integrated circuit outputs | Salvatore F. Cagnina | 1988-03-29 |
| 4709467 | Non-selective implantation process for forming contact regions in integrated circuits | — | 1987-12-01 |