Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
VD

Valery M. Dubin — 114 Patents

Intel: 93 patents #233 of 30,777Top 1%
AMD: 14 patents #820 of 9,279Top 9%
CFCornell Research Foundation: 5 patents #159 of 1,638Top 10%
SESematech: 5 patents #5 of 123Top 5%
MIMoses Lake Industries: 2 patents #1 of 12Top 9%
FIFsi International: 1 patents #60 of 131Top 50%
Portland, OR: #93 of 9,213 inventorsTop 2%
Oregon: #164 of 28,073 inventorsTop 1%
Overall (All Time): #11,115 of 4,157,543Top 1%
114 Patents All Time

Issued Patents All Time

Showing 101–114 of 114 patents

Patent #TitleCo-InventorsDate
6065424 Electroless deposition of metal films with spray processor Yosi Shacham-Diamand, Vinh Van Nguyen 2000-05-23
6001415 Via with barrier layer for impeding diffusion of conductive material from via into insulator Takeshi Nogami 1999-12-14
5972192 Pulse electroplating copper or copper alloys Chiu H. Ting, Robin Cheung 1999-10-26
5969422 Plated copper interconnect structure Chiu H. Ting 1999-10-19
5968333 Method of electroplating a copper or copper alloy interconnect Takeshi Nogami, Robin Cheung 1999-10-19
5913147 Method for fabricating copper-aluminum metallization Chiu H. Ting 1999-06-15
5895562 Gas shielding during plating 1999-04-20
5891513 Electroless CU deposition on a barrier layer by CU contact displacement for ULSI applications Yosef Shacham-Diamand, Chiu H. Ting, Bin Zhao, Prahalad K. Vasudev 1999-04-06
5882498 Method for reducing oxidation of electroplating chamber contacts and improving uniform electroplating of a substrate Takeshi Nogami 1999-03-16
5833820 Electroplating apparatus 1998-11-10
5830805 Electroless deposition equipment or apparatus and method of performing electroless deposition Yosi Shacham-Diamand, Chiu H. Ting, Bin Zhao, Prahalad K. Vasudev 1998-11-03
5824599 Protected encapsulation of catalytic layer for electroless copper interconnect Yosef Schacham-Diamand, Chiu H. Ting, Bin Zhao, Prahalad K. Vasudev, Melvin Joseph DeSilva 1998-10-20
5695810 Use of cobalt tungsten phosphide as a barrier material for copper metallization Yosi Schacham-Diamand, Bin Zhao, Prahalad K. Vasudev, Chiu H. Ting 1997-12-09
5674787 Selective electroless copper deposited interconnect plugs for ULSI applications Bin Zhao, Prahalad K. Vasudev, Yosef Shacham-Diamand, Chiu H. Ting 1997-10-07