| 7109569 |
Dual referenced microstrip |
Chee-Yee Chung, Alex Waizman, Teong Guan Yew |
2006-09-19 |
| 7024565 |
Method and apparatus to detect circuit tampering |
Mark A. Beiley |
2006-04-04 |
| 6806569 |
Multi-frequency power delivery system |
Mark A. Beiley |
2004-10-19 |
| 6697112 |
Imaging system having multiple image capture modes |
Tonia G. Morris, Kevin M. Connolly |
2004-02-24 |
| 6686819 |
Dual referenced microstrip |
Chee-Yee Chung, Alex Waizman, Teong Guan Yew |
2004-02-03 |
| 6410359 |
Reduced leakage trench isolation |
Kevin M. Connolly, Jung Kang, Berni W. Landau, Akira Kakizawa, Joseph Parks +4 more |
2002-06-25 |
| 6403394 |
Reduced leakage trench isolation |
Kevin M. Connolly, Jung Kang, Berni W. Landau, Akira Kakizawa |
2002-06-11 |
| 6396539 |
CMOS imaging device with integrated defective pixel correction circuitry |
Jack Heller |
2002-05-28 |
| 6362695 |
Method and apparatus to produce a random bit sequence |
Mark A. Beiley |
2002-03-26 |
| 6306679 |
Photodiode having transparent insulating film around gate islands above P-N junction |
Jung Kang |
2001-10-23 |
| 6293465 |
CMOS imaging device with integrated identification circuitry |
Jack Heller |
2001-09-25 |
| 6259145 |
Reduced leakage trench isolation |
Kevin M. Connolly, Jung Kang, Berni W. Landau, Akira Kakizawa |
2001-07-10 |
| 6215165 |
Reduced leakage trench isolation |
Kevin M. Connolly, Jung Kang, Berni W. Landau, Akira Kakizawa, Joseph Parks +4 more |
2001-04-10 |
| 6091093 |
Photodiode having transparent insulating film around gate islands above p-n junction |
Jung Kang |
2000-07-18 |