AK

Akira Kakizawa

IN Intel: 13 patents #3,143 of 30,777Top 15%
Overall (All Time): #381,706 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
9658288 Alternating current coupled electronic component test system and method Bharani Thiruvengadam 2017-05-23
9389274 Alternating current coupled electronic component test system and method Bharani Thiruvengadam 2016-07-12
7154288 Method and an apparatus for testing transmitter and receiver Ronald W. Swartz 2006-12-26
7061224 Test circuit for delay lock loops Mark A. Beiley, Mamun Ur Rashid 2006-06-13
7002365 Method and an apparatus for testing transmitter and receiver Ronald W. Swartz 2006-02-21
6889350 Method and apparatus for testing an I/O buffer Eric T. Fought, Cass A. Blodgett 2005-05-03
6725406 Method and apparatus for failure detection utilizing functional test vectors and scan mode Erik T. Fought 2004-04-20
6580556 Viewing stereoscopic image pairs 2003-06-17
6566857 Testing of digital-to-analog converters Carlos A. Ortega, Mark A. Arellano 2003-05-20
6410359 Reduced leakage trench isolation Kevin M. Connolly, Jung Kang, Berni W. Landau, James Breisch, Joseph Parks +4 more 2002-06-25
6403394 Reduced leakage trench isolation Kevin M. Connolly, Jung Kang, Berni W. Landau, James Breisch 2002-06-11
6259145 Reduced leakage trench isolation Kevin M. Connolly, Jung Kang, Berni W. Landau, James Breisch 2001-07-10
6215165 Reduced leakage trench isolation Kevin M. Connolly, Jung Kang, Berni W. Landau, James Breisch, Joseph Parks +4 more 2001-04-10