EF

Erik T. Fought

IN Intel: 1 patents #18,218 of 30,777Top 60%
Overall (All Time): #3,476,875 of 4,157,543Top 85%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6725406 Method and apparatus for failure detection utilizing functional test vectors and scan mode Akira Kakizawa 2004-04-20