EF

Eric T. Fought

IN Intel: 2 patents #13,213 of 30,777Top 45%
Overall (All Time): #2,120,711 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7702981 Structural testing using boundary scan techniques James J. Grealish, Dave F. Dubberke, Milo J. Juenemann, Christopher J. Koza 2010-04-20
6889350 Method and apparatus for testing an I/O buffer Cass A. Blodgett, Akira Kakizawa 2005-05-03