Issued Patents All Time
Showing 101–120 of 120 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6368878 | Intentional asymmetry imposed during fabrication and/or access of magnetic tunnel junction devices | William J. Gallagher, Philip L. Trouilloud | 2002-04-09 |
| 6239936 | Method and apparatus for calibrating a thermal response of a magnetoresistive element | Timothy J. Chainer, Karl-Friedrich Etzold, Hal Hjalmar Ottesen, Gordon James Smith | 2001-05-29 |
| 6104633 | Intentional asymmetry imposed during fabrication and/or access of magnetic tunnel junction devices | William J. Gallagher, Philip L. Trouilloud | 2000-08-15 |
| 6088176 | Method and apparatus for separating magnetic and thermal components from an MR read signal | Gordon James Smith, Hal Hjalmar Ottesen, Anthony P. Praino, Mark E. Re, Hemantha K. Wickramasinghe | 2000-07-11 |
| 6072718 | Magnetic memory devices having multiple magnetic tunnel junctions therein | William J. Gallagher, Philip L. Trouilloud | 2000-06-06 |
| 6069615 | Single pointing device/keyboard for multiple computers | Robert S. Olyha, Jr. | 2000-05-30 |
| 6052249 | Method and apparatus for data storage using thermal proximity imaging | Anthony P. Praino, Mark E. Re, Hemantha K. Wickramasinghe | 2000-04-18 |
| 6019503 | Method for identifying surface conditions of a moving medium | Timothy J. Chainer | 2000-02-01 |
| 6004030 | Calibration apparatus and methods for a thermal proximity sensor | Erhard Schreck | 1999-12-21 |
| 5946228 | Limiting magnetic writing fields to a preferred portion of a changeable magnetic region in magnetic devices | Philip L. Trouilloud | 1999-08-31 |
| 5850374 | Method and apparatus for data storage using thermal proximity imaging | Anthony P. Praino, Mark E. Re, Hemantha K. Wickramasinghe | 1998-12-15 |
| 5810477 | System for identifying surface conditions of a moving medium | Timothy J. Chainer | 1998-09-22 |
| 5806978 | Calibration apparatus and methods for a thermal proximity sensor | Timothy J. Chainer, Karl-Friedrich Etzold | 1998-09-15 |
| 5753803 | Apparatus and methods for maintaining a substantially constant temperature in a thermal proximity sensor | Timothy J. Chainer, Ferdinand Hendriks | 1998-05-19 |
| 5543918 | Through-the-lens confocal height measurement | Danny Wong | 1996-08-06 |
| 5527110 | Method and apparatus for detecting asperities on magnetic disks using thermal proximity imaging | Anthony P. Praino, Mark E. Re, Hemantha K. Wickramasinghe | 1996-06-18 |
| 5267471 | Double cantilever sensor for atomic force microscope | Martin P. O'Boyle | 1993-12-07 |
| 5263776 | Multi-wavelength optical thermometry | William M. Holber, Joseph S. Logan, Hemantha K. Wickramasinghe | 1993-11-23 |
| 5260577 | Sample carriage for scanning probe microscope | James Michael Hammond, Martin Klos, Kenneth Gilbert Roessler, Robert Marshall Stowell, Hemantha K. Wickramasinghe | 1993-11-09 |
| 4992659 | Near-field lorentz force microscopy | Hemantha K. Wickramasinghe | 1991-02-12 |