Issued Patents All Time
Showing 51–75 of 85 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7133127 | Lighting optical machine and defect inspection system | Masami Iizuka, Tadashi Suzuki, Hiroshi Goto, Takayuki Ono | 2006-11-07 |
| 7010447 | Method for inspecting defect and system therefor | Takanori Ninomiya, Seiji Isogai, Toshiei Kurosaki | 2006-03-07 |
| 6792359 | Method for inspecting defect and system therefor | Takanori Ninomiya, Seiji Isogai, Toshiei Kurosaki | 2004-09-14 |
| 6683683 | Defect inspection method and apparatus for silicon wafer | Koji Tomita, Muneo Maeshima, Yoshitaka Kodama, Hitoshi Komuro, Kazuo Takeda | 2004-01-27 |
| 6421308 | State detecting device and optical disk device | Naoki Kizu, Kazuhiro Sugiyama, Noboru Yashima, Yukari Hiratsuka | 2002-07-16 |
| 6384909 | Defect inspection method and apparatus for silicon wafer | Koji Tomita, Muneo Maeshima, Yoshitaka Kodama, Hitoshi Komuro, Kazuo Takeda | 2002-05-07 |
| 6331967 | Disk-rotation control apparatus | Noboru Yashima, Naoki Kizu, Kazuhiro Sugiyama, Yukari Hiratsuka | 2001-12-18 |
| 6275878 | Data recorder and data producing circuit | Noboru Yashima, Kazuhiro Sugiyama, Yukari Hiratsuka, Naoki Kizu | 2001-08-14 |
| 6259662 | Disk rotation control device | Kazuhiro Sugiyama, Yukari Hiratsuka, Noboru Yashima, Naoki Kizu | 2001-07-10 |
| 6256092 | Defect inspection apparatus for silicon wafer | Koji Tomita, Muneo Maeshima, Yoshitaka Kodama, Hitoshi Komuro, Kazuo Takeda | 2001-07-03 |
| 6226079 | Defect assessing apparatus and method, and semiconductor manufacturing method | Kazuo Takeda, Makoto Ohkura, Seiichi Isomae, Kyoko Minowa, Muneo Maeshima +2 more | 2001-05-01 |
| 6191849 | Wafer inspecting apparatus | Muneo Maeshima, Kazuo Takeda | 2001-02-20 |
| 6160615 | Surface measurement apparatus for detecting crystal defects of wafer | Muneo Maeshima, Isao Nemoto | 2000-12-12 |
| 6157444 | Defect inspection apparatus for silicon wafer | Koji Tomita, Muneo Maeshima, Hitoshi Komuro, Kazuo Takeda | 2000-12-05 |
| 6118742 | Disk-rotation control apparatus | Noboru Yashima, Naoki Kizu, Kazuhiro Sugiyama, Yukari Hiratsuka | 2000-09-12 |
| 6108079 | Method for measuring crystal defect and equipment using the same | Muneo Maeshima, Kazuo Takeda, Isao Nemoto, Yoshitaka Kodama | 2000-08-22 |
| 5892581 | Absorptivity detecting apparatus, chromatographic apparatus, method of detecting absorptivity and method of chromatography | Toshihiko Sakaide, Masahito Ito, Yoshio Fujii | 1999-04-06 |
| 5557404 | Spectrophotometer with a system for calibrating a monochromator | Akira Owada | 1996-09-17 |
| 5253183 | Obtaining a spectrogram from a single scanning of interference fringes | Masaru Inoue | 1993-10-12 |
| D337334 | High speed electroforming system | Masao Tokita, Shinichi Omura | 1993-07-13 |
| 5179733 | Wristwatch band with radio antenna | — | 1993-01-12 |
| 5152693 | Clasp to join straps containing an antenna for a portable information device | Taeko Imai | 1992-10-06 |
| 4939463 | Image reconstruction method in NMR imaging | Kensuke Sekihara, Hideki Kohno | 1990-07-03 |
| 4797616 | High speed NMR spectroscopic imaging method | Takashi Onodera, Kensuke Sekihara, Hidemi Shiono, Hideki Kohno | 1989-01-10 |
| 4777443 | Inspection apparatus based on nuclear magnetic resonance | Masao Yabusaki, Etsuji Yamamoto, Takashi Onodera, Yukiko Ogura, Hideaki Nakane +1 more | 1988-10-11 |