Issued Patents All Time
Showing 26–50 of 85 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8035808 | Surface defect inspection method and apparatus | Yoshimasa Oshima, Toshiyuki Nakao | 2011-10-11 |
| 7990530 | Optical inspection method and optical inspection apparatus | — | 2011-08-02 |
| 7973922 | Optical inspection method and optical inspection apparatus | — | 2011-07-05 |
| 7952701 | Surface inspection method and inspecting device using the same | — | 2011-05-31 |
| 7916287 | Surface inspection method and surface inspection apparatus | Masayuki Hachiya | 2011-03-29 |
| 7872742 | Surface inspection method and surface inspection apparatus | — | 2011-01-18 |
| 7853068 | Pattern defect inspection method and apparatus | Katsuya Suzuki | 2010-12-14 |
| 7773210 | Appearance inspection apparatus | Kenji Oka | 2010-08-10 |
| 7764367 | Surface inspection method and surface inspection apparatus | — | 2010-07-27 |
| 7761246 | Surface inspection method and surface inspection apparatus | — | 2010-07-20 |
| 7755751 | Optical inspection method and optical inspection apparatus | — | 2010-07-13 |
| 7719669 | Surface inspection method and surface inspection apparatus | Masayuki Hachiya | 2010-05-18 |
| 7710557 | Surface defect inspection method and apparatus | Yoshimasa Oshima, Toshiyuki Nakao | 2010-05-04 |
| 7671980 | Surface inspection method and surface inspection apparatus | — | 2010-03-02 |
| 7619729 | Method for detecting particles and defects and inspection equipment thereof | Takahiro Togashi | 2009-11-17 |
| 7616805 | Pattern defect inspection method and apparatus | Katsuya Suzuki | 2009-11-10 |
| 7602482 | Optical inspection method and optical inspection apparatus | — | 2009-10-13 |
| 7558683 | Method for inspecting defect and system therefor | Takanori Ninomiya, Seiji Isogai, Toshiei Kurosaki | 2009-07-07 |
| 7557911 | Appearance inspection apparatus | Kenji Oka | 2009-07-07 |
| 7535562 | Apparatus and method for defect inspection | Masaaki Ito | 2009-05-19 |
| 7487049 | Surface inspection method and surface inspection apparatus | — | 2009-02-03 |
| 7457455 | Pattern defect inspection method and apparatus | Katsuya Suzuki | 2008-11-25 |
| 7456948 | Method for detecting particles and defects and inspection equipment thereof | Takahiro Togashi | 2008-11-25 |
| 7417720 | Lighting optical machine and defect inspection system | Masami Iizuka, Tadashi Suzuki, Hiroshi Goto, Takayuki Ono | 2008-08-26 |
| 7305314 | Method for inspecting defect and system therefor | Takanori Ninomiya, Seiji Isogai, Toshiei Kurosaki | 2007-12-04 |