Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10884008 | Device for storing biochemical reagents, and biochemical analyzer | Taro Nakazawa, Motohiro Yamazaki, Tatsuya Yamashita | 2021-01-05 |
| 10753873 | Multicolor detection device | Takashi Anazawa, Satoshi Takahashi, Motohiro Yamazaki | 2020-08-25 |
| 10451553 | Fluorescence spectrometer | Motohiro Yamazaki, Yuichiro Ota, Satoshi Takahashi | 2019-10-22 |
| 10175172 | Multicolor detection device | Takashi Anazawa, Satoshi Takahashi, Motohiro Yamazaki | 2019-01-08 |
| 9921160 | Multichannel analysis device | Takashi Anazawa, Motohiro Yamazaki, Kunio Harada | 2018-03-20 |
| 9770713 | Nucleic acid analysis device | Takanobu Haga, Tomohiro Shoji, Takamichi Muramatsu, Shuhei Yamamoto | 2017-09-26 |
| 9657286 | Pre-processing/electrophoresis integrated cartridge, pre-processing integrated capillary electrophoresis device, and pre-processing integrated capillary electrophoresis method | Yukari Sahoyama, Motohiro Yamazaki, Takamichi Muramatsu | 2017-05-23 |
| 8685220 | Capillary electrophoresis apparatus | Takeshi Ohura, Ryoji Inaba, Hiromi Yamashita, Manabu Akiba, Tomohiro Shoji | 2014-04-01 |
| 8252162 | Capillary electrophoresis apparatus | Takeshi Ohura, Ryoji Inaba, Hiromi Yamashita, Manabu Akiba, Tomohiro Shoji | 2012-08-28 |
| 7513984 | Capillary array electrophoresis apparatus | Ryoji Inaba, Satoshi Takahashi, Miho Ozawa | 2009-04-07 |
| 7459068 | Multi-capillary electrophoresis apparatus | Eric S. Nordman, Miho Ozawa, Masaya Kojima, Ryoji Inaba, Motohiro Yamazaki | 2008-12-02 |
| 6808610 | Capillary array electrophoresis apparatus | Ryoji Inaba, Satoshi Takahashi, Miho Ozawa | 2004-10-26 |
| 6683683 | Defect inspection method and apparatus for silicon wafer | Koji Tomita, Muneo Maeshima, Shigeru Matsui, Hitoshi Komuro, Kazuo Takeda | 2004-01-27 |
| 6384909 | Defect inspection method and apparatus for silicon wafer | Koji Tomita, Muneo Maeshima, Shigeru Matsui, Hitoshi Komuro, Kazuo Takeda | 2002-05-07 |
| 6256092 | Defect inspection apparatus for silicon wafer | Koji Tomita, Muneo Maeshima, Shigeru Matsui, Hitoshi Komuro, Kazuo Takeda | 2001-07-03 |
| 6108079 | Method for measuring crystal defect and equipment using the same | Muneo Maeshima, Kazuo Takeda, Isao Nemoto, Shigeru Matsui | 2000-08-22 |