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| 9048336 |
Reduced threshold voltage-width dependency in transistors comprising high-k metal gate electrode structures |
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| 8664068 |
Low-diffusion drain and source regions in CMOS transistors for low power/high performance applications |
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| 8586440 |
Methods for fabricating integrated circuits using non-oxidizing resist removal |
Stefan Flachowsky, Thomas Feudel |
2013-11-19 |
| 8508001 |
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| 6017018 |
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2000-01-25 |