Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7410857 | Semiconductor memory device and manufacturing method thereof | Masahiko Higashi, Manabu Nakamura, Kentaro Sera, Hiroyuki Nansei, Yukihiro Utsuno +1 more | 2008-08-12 |
| 7253046 | Semiconductor memory device and manufacturing method thereof | Masahiko Higashi, Manabu Nakamura, Kentaro Sera, Hiroyuki Nansei, Yukihiro Utsuno +1 more | 2007-08-07 |
| 7098147 | Semiconductor memory device and method for manufacturing semiconductor device | Hiroyuki Nansei, Manabu Nakamura, Kentaro Sera, Masahiko Higashi, Yukihiro Utsuno +1 more | 2006-08-29 |
| 6444530 | Process for fabricating an integrated circuit with a self-aligned contact | Hung-Sheng Chen, Unsoon Kim, Yu Sun, Chi Chang, Mark T. Ramsbey +4 more | 2002-09-03 |
| 6444539 | Method for producing a shallow trench isolation filled with thermal oxide | Yu Sun, Angela T. Hui, Yue-Song He, Mark S. Chang, Chi Chang +1 more | 2002-09-03 |
| 6420224 | Stepper alignment mark formation with dual field oxide process | Mark S. Chang | 2002-07-16 |
| 6249036 | Stepper alignment mark formation with dual field oxide process | Mark S. Chang | 2001-06-19 |
| 6232646 | Shallow trench isolation filled with thermal oxide | Yu Sun, Angela T. Hui, Yue-Song He, Mark S. Chang, Chi Chang +1 more | 2001-05-15 |
| 6014329 | Flash-erasable semiconductor memory device having an improved reliability | Takao Akaogi, Yasushige Ogawa, Hisayoshi Watanabe, Minoru Yamashita | 2000-01-11 |
| 5950086 | Method of fabricating an EPROM type device with reduced process residues | Satoshi Takahashi, Hideo Kurihara, Hideki Komori, Masaaki Higashitani | 1999-09-07 |
| 5910916 | Flash-erasable semiconductor memory device having improved reliability | Takao Akaogi, Yasushige Ogawa, Hisayoshi Watanabe, Minoru Yamashita | 1999-06-08 |
| 5907781 | Process for fabricating an integrated circuit with a self-aligned contact | Hung-Sheng Chen, Unsoon Kim, Yu Sun, Chi Chang, Mark T. Ramsbey +4 more | 1999-05-25 |
| 5870337 | Flash-erasable semiconductor memory device having an improved reliability | Takao Akaogi, Yasushige Ogawa, Hisayoshi Watanabe, Minoru Yamashita | 1999-02-09 |
| 5835408 | Flash-erasable semiconductor memory device having an improved reliability | Takao Akaogi, Yasushige Ogawa, Hisayoshi Watanabe, Minoru Yamashita | 1998-11-10 |
| 5835416 | Flash-erasable semiconductor memory device having an improved reliability | Takao Akaogi, Yasushige Ogawa, Hisayoshi Watanabe, Minoru Yamashita | 1998-11-10 |
| 5761127 | Flash-erasable semiconductor memory device having an improved reliability | Takao Akaogi, Yasushige Ogawa, Hisayoshi Watanabe, Minoru Yamashita | 1998-06-02 |
| 5641979 | Semiconductor memory device having electrically erasable programmable read only memory and dynamic random access memory functions and method of writing, reading and erasing information therefor | Taiji Ema | 1997-06-24 |
| 5497018 | Semiconductor memory device having a floating gate with improved insulation film quality | — | 1996-03-05 |
| 5468664 | Method of making semiconductor device with alignment marks | — | 1995-11-21 |
| 5449629 | Method for fabricating a semiconductor memory device having a floating gate with improved insulation film quality | — | 1995-09-12 |
| 5391902 | Semiconductor device and production method thereof | — | 1995-02-21 |