JF

John C. Flake

FS Freeescale Semiconductor: 5 patents #628 of 3,767Top 20%
IBM: 5 patents #18,733 of 70,183Top 30%
AM AMD: 1 patents #5,683 of 9,279Top 65%
BU Board Of Supervisors Of Louisiana State University: 1 patents #13 of 102Top 15%
Motorola: 1 patents #6,475 of 12,470Top 55%
Overall (All Time): #406,384 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11591699 Electrochemical reactor for upgrading methane and small alkanes to longer alkanes and alkenes Christopher George Arges, Yuxin Fang 2023-02-28
7989347 Process for filling recessed features in a dielectric substrate 2011-08-02
7579279 Method to passivate conductive surfaces during semiconductor processing Kevin Cooper, Saifi Usmani 2009-08-25
7456105 CMP metal polishing slurry and process with reduced solids concentration Kevin Cooper, Jennifer L. Cooper, János Farkas, Johannes Groschopf, Yuri Solomentsev 2008-11-25
7387970 Method of using an aqueous solution and composition thereof Kevin Cooper, Johannes Groschopf, Yuri Solomentsev 2008-06-17
7188630 Method to passivate conductive surfaces during semiconductor processing Kevin Cooper, Saifi Usmani 2007-03-13
7001498 Electroplating apparatus and four mask TFT array process with electroplated metal Evan G. Colgan, Lubomyr T. Romankiw, Robert L. Wisnieff 2006-02-21
6866791 Method of forming patterned nickel and doped nickel films via microcontact printing and uses thereof Tricia Breen, Peter M. Fryer, Robert L. Wisnieff 2005-03-15
6838354 Method for forming a passivation layer for air gap formation Cindy Goldberg, Stanley M. Filipiak, Yeong-Jyh T. Lii, Bradley P. Smith, Yuri Solomentsev +3 more 2005-01-04
6767828 Method for forming patterns for semiconductor devices Paul S. Andry, Bruno Michel, Takatoshi Tsujimura 2004-07-27
6620719 Method of forming ohmic contacts using a self doping layer for thin-film transistors Paul S. Andry, Evan G. Colgan, Peter M. Fryer, William Graham, Eugene J. O'Sullivan 2003-09-16
6495005 Electroplating apparatus Evan G. Colgan, Lubomyr T. Romankiw, Robert L. Wisnieff 2002-12-17