| 10778204 |
Comparator circuit with low power consumption and low kickback noise |
Chung-Chih Hung |
2020-09-15 |
| 10439621 |
Two-step switching method for a circuit switch |
Chung-Chih Hung |
2019-10-08 |
| 10277122 |
Charge pump circuit and phase locked loop system using the same |
Chung-Chih Hung |
2019-04-30 |
| 9093179 |
Chip capable of improving test coverage of pads and related method thereof |
Ming-Cheng Liang, Kuo-Cheng Ting |
2015-07-28 |
| 8773931 |
Method of detecting connection defects of memory and memory capable of detecting connection defects thereof |
Min-Chih Chang, Te-Yi Yu, Lien-Sheng Yang |
2014-07-08 |
| 8773179 |
Input receiver and operation method thereof |
Yi-Hao Chang, Wen-Tung Yang, Yen-An Chang |
2014-07-08 |
| 8520453 |
Device for generating a test pattern of a memory chip and method thereof |
Chun-Ching Hsia, Che-Chun Ou Yang |
2013-08-27 |
| 8345500 |
Memory having a disabling circuit and method for disabling the memory |
Der-Min Yuan |
2013-01-01 |
| 8201035 |
Testing system and method thereof |
Kuo-Hua Lee, Chih-Ming Cheng |
2012-06-12 |
| 8125838 |
System in package integrated circuit with self-generating reference voltage |
Der-Min Yuan |
2012-02-28 |
| 7983102 |
Data detecting apparatus and methods thereof |
Der-Min Yuan, Bor-Doou Rong, Chun Shiah |
2011-07-19 |
| 7978525 |
Data flow scheme for low power DRAM |
Der-Min Yuan |
2011-07-12 |
| 7924641 |
Data flow scheme for low power DRAM |
Der-Min Yuan |
2011-04-12 |
| 7663949 |
Memory row architecture having memory row redundancy repair function |
Der-Min Yuan |
2010-02-16 |
| 7475305 |
Method of high speed data rate testing |
Tah-Kang Joseph Ting, Hong Jie Chen |
2009-01-06 |
| 7359265 |
Data flow scheme for low power DRAM |
Der-Min Yuan |
2008-04-15 |
| 6943044 |
Method of high speed data rate testing |
Tah-Kang Joseph Ting, Hong Jie Chen |
2005-09-13 |