Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8773931 | Method of detecting connection defects of memory and memory capable of detecting connection defects thereof | Min-Chih Chang, Shih-Hsing Wang, Lien-Sheng Yang | 2014-07-08 |
| 8331178 | Memory device capable of operation in a burn in stress mode, method for performing burn in stress on a memory device, and method for detecting leakage current of a memory device | Shi-Huei Liu, Tzu-Hao Chen, Ming-Hong Kuo | 2012-12-11 |