Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378620 | Method and system for detecting abnormal die | Shou-Kang Fan | 2022-07-05 |
| 11195592 | Memory inspecting method and memory inspecting system | Pailu Wang | 2021-12-07 |
| 9153344 | Device for detecting defective global word line | Hung-Wen Chang | 2015-10-06 |
| 8773931 | Method of detecting connection defects of memory and memory capable of detecting connection defects thereof | Min-Chih Chang, Shih-Hsing Wang, Te-Yi Yu | 2014-07-08 |
| 8543877 | Method of performing a chip burn-in scanning with increased efficiency | Wei-Ju Chen, Shi-Huei Liu | 2013-09-24 |
| 7965577 | Word line defect detecting device and method thereof | Wei-Jen Chen, Ho-Yin Chen, Shu-Jen Wu | 2011-06-21 |
| 7623388 | Method for detecting erroneous word lines of a memory array and device thereof | Tzu-Hao Chen, Jen-Shou Hsu, Yin-Ming Lan | 2009-11-24 |