TC

Tzu-Hao Chen

ET Etron Technology: 2 patents #47 of 145Top 35%
TI Trend Micro Incorporated: 1 patents #304 of 749Top 45%
Overall (All Time): #1,557,191 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8331178 Memory device capable of operation in a burn in stress mode, method for performing burn in stress on a memory device, and method for detecting leakage current of a memory device Shi-Huei Liu, Te-Yi Yu, Ming-Hong Kuo 2012-12-11
8074279 Detecting rogue access points in a computer network Ching-Lung Lin 2011-12-06
7623388 Method for detecting erroneous word lines of a memory array and device thereof Jen-Shou Hsu, Lien-Sheng Yang, Yin-Ming Lan 2009-11-24