Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12235329 | Synchronous rectification circuit | Yuan-Kai Cheng | 2025-02-25 |
| 10778204 | Comparator circuit with low power consumption and low kickback noise | Shih-Hsing Wang | 2020-09-15 |
| 10596375 | Cochlear implant device and stimulating method thereof | Chia-Fone Lee, Yuan-Fang Chou, Chung-Yu Wu, Ming-Dou Ker, Xin Qian | 2020-03-24 |
| 10536135 | Pseudo resistor with tunable resistance | Jia-Heng Chang | 2020-01-14 |
| 10510677 | Die | Yung-Teng Tsai, Hung-Chin Lin, Chia-Chen Sun, Chih-Yu Wu, Jun Chen +1 more | 2019-12-17 |
| 10439621 | Two-step switching method for a circuit switch | Shih-Hsing Wang | 2019-10-08 |
| 10277122 | Charge pump circuit and phase locked loop system using the same | Shih-Hsing Wang | 2019-04-30 |
| 10156526 | Method for reviewing defects | Yung-Teng Tsai, Hung-Chin Lin, Chia-Chen Sun, Chih-Yu Wu, Jun Chen +1 more | 2018-12-18 |
| 10122200 | Lithium battery control circuit and lithium battery charger with surge current protection | Chun-Yen Chiang | 2018-11-06 |
| 10082471 | Semiconductor structure and method for reviewing defects | Yung-Teng Tsai, Hung-Chin Lin, Chia-Chen Sun, Chih-Yu Wu, Jun Chen +1 more | 2018-09-25 |
| 9800259 | Digital to analog converter for performing digital to analog conversion with current source arrays | Fang-Ting Chou | 2017-10-24 |
| 9711326 | Test structure for electron beam inspection and method for defect determination using electron beam inspection | Kuan-Chun Lin, Chih-Chieh Chou, Shih-Cheng Chen, Yung-Teng Tsai, Chi-Hung Chan | 2017-07-18 |
| 9641015 | Charging structure | Yi-An Chen | 2017-05-02 |
| 8427351 | Digital-to-analog conversion device | Fang-Ding Chou | 2013-04-23 |
| 8242943 | Digital-to-analog converter | Wen-Hung Hsieh | 2012-08-14 |
| 8144047 | Current-mode dual-slope temperature-digital conversion device | Ming-Tse Lin | 2012-03-27 |