Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12429762 | Method of forming a layout pattern and photomask | En-Chiuan Liou, Song-Yi Lin | 2025-09-30 |
| 12416855 | Photomask structure | Song-Yi Lin, En-Chiuan Liou | 2025-09-16 |
| 12394730 | Semiconductor structure | En-Chiuan Liou | 2025-08-19 |
| 12321287 | Interconnects for physically unclonable function and method of achieving physically unclonable function through interconnects | Chang-Yih Chen, Yi-Wen Chen | 2025-06-03 |
| 12322711 | Die seal ring structure | En-Chiuan Liou | 2025-06-03 |
| 12261083 | Semiconductor device and method for fabricating the same | — | 2025-03-25 |
| 11372324 | Method for correcting mask pattern and mask pattern thereof | Yu-Cheng Tung, Sheng-Yuan Hsueh, Fan-Wei Lin | 2022-06-28 |
| 10983428 | Mask and method of forming pattern | Yu-Cheng Tung, Sheng-Yuan Hsueh | 2021-04-20 |
| 10566290 | Alignment mark and measurement method thereof | Yu-Cheng Tung, Sheng-Yuan Hsueh, Fan-Wei Lin | 2020-02-18 |
| 10510677 | Die | Yung-Teng Tsai, Hung-Chin Lin, Chih-Yu Wu, Jun Chen, Chung-Chih Hung +1 more | 2019-12-17 |
| 10176289 | Method for decomposing semiconductor layout pattern | Yu-Cheng Tung | 2019-01-08 |
| 10156526 | Method for reviewing defects | Yung-Teng Tsai, Hung-Chin Lin, Chih-Yu Wu, Jun Chen, Chung-Chih Hung +1 more | 2018-12-18 |
| 10082471 | Semiconductor structure and method for reviewing defects | Yung-Teng Tsai, Hung-Chin Lin, Chih-Yu Wu, Jun Chen, Chung-Chih Hung +1 more | 2018-09-25 |
| 9147678 | Resistor and fabrication method thereof | Chih-Kai Kang, Sheng-Yuan Hsueh, Shu-Hsuan Chih, Po-Kuang Hsieh, Po-Cheng Huang +8 more | 2015-09-29 |
| 8890551 | Test key structure and method for measuring step height by such test key structure | Chih-Kai Kang, Shu-Hsuan Chih, Sheng-Yuan Hsueh, Po-Kuang Hsieh, Chi-Horn Pai +1 more | 2014-11-18 |
| 8850370 | Method of manufacturing semiconductor circuit structure | Shih-Chieh Hsu, Yi-Chung Sheng, Sheng-Yuan Hsueh, Yao-Chang Wang | 2014-09-30 |
| 8624398 | Semiconductor circuit structure | Shih-Chieh Hsu, Yi-Chung Sheng, Sheng-Yuan Hsueh, Yao-Chang Wang | 2014-01-07 |
| 7932104 | Method for inspecting photoresist pattern | Yi-Chung Sheng, Sheng-Yuan Hsueh | 2011-04-26 |