Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11372324 | Method for correcting mask pattern and mask pattern thereof | Chia-Chen Sun, Yu-Cheng Tung, Sheng-Yuan Hsueh | 2022-06-28 |
| 10566290 | Alignment mark and measurement method thereof | Chia-Chen Sun, Yu-Cheng Tung, Sheng-Yuan Hsueh | 2020-02-18 |